Damage-resistant single-pulse optics for x-ray free electron lasers

Stefan P. Hau-Riege; Richard A. London; Michael Bogan; Henry N. Chapman; Magnus Bergh

doi:10.1117/12.723994

18 May 2007 Damage-resistant single-pulse optics for x-ray free electron lasers

Stefan P. Hau-Riege, Richard A. London, Michael Bogan, Henry N. Chapman, Magnus Bergh

Proceedings Volume 6586, Damage to VUV, EUV, and X-ray Optics; 65860T (2007) https://doi.org/10.1117/12.723994
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

Short-pulse ultraviolet and x-ray free electron lasers of unprecedented peak brightness are in the process of revolutionizing physics, chemistry, and biology. Optical components for these new light sources have to be able to withstand exposure to the extremely high-fluence photon pulses. Whereas most optics have been designed to stay intact for many pulses, it has also been suggested that single-pulse optics that function during the pulse but disintegrate on a longer timescale, may be useful at higher fluences than multiple-pulse optics. In this paper we will review damage-resistant single-pulse optics that recently have been demonstrated at the FLASH soft-x-ray laser facility at DESY, including mirrors, apertures, and nanolenses. It was found that these objects stay intact for the duration of the 25-fs FLASH pulse, even when exposed to fluences that exceed the melt damage threshold by fifty times or more. We present a computational model for the FLASH laser-material interaction to analyze the extent to which the optics still function during the pulse. Comparison to experimental results obtained at FLASH shows good quantitative agreement.

Citation Download Citation

Stefan P. Hau-Riege, Richard A. London, Michael Bogan, Henry N. Chapman, and Magnus Bergh "Damage-resistant single-pulse optics for x-ray free electron lasers", Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860T (18 May 2007); https://doi.org/10.1117/12.723994

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