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Proceedings Article

National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis

[+] Author Affiliations
Jonathan W. Arenberg

TRW Space & Electronics Group (USA)

Wolfgang Riede

DLR Institut fuer Technische Physik (Germany)

Ulrike Broulik, Bernhard Steiger

Hochschule fuer Technik und Wirtschaft (Germany)

Uwe Willamowski, Detlev Ristau

Laser Zentrum Hannover e.V. (Germany)

Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, 645 (April 7, 1999); doi:10.1117/12.344410
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From Conference Volume 3578

  • Laser-Induced Damage in Optical Materials: 1998
  • Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau
  • Boulder, CO | September 28, 1998

abstract

This paper presents a second look at analyzing the results from the recently held German National damage test round robin experiment. This experiment was performed under the auspices of CHOCLAB to validate the method in ISO/DIS 11254- 1.2. The result of the experiment are re-examined in terms of an improved threshold determination procedure, and the result are correlated for each sample type. Differences in detailed experimental set-up are examined and their effect on the outcome evaluated. The measured threshold are shown to agree well with one another intramurally. Results from two of the three laboratories involved show good extramural correlation.

© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jonathan W. Arenberg ; Wolfgang Riede ; Ulrike Broulik ; Bernhard Steiger ; Uwe Willamowski, et al.
"National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, 645 (April 7, 1999); doi:10.1117/12.344410; http://dx.doi.org/10.1117/12.344410


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