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Proceedings Article

Characterization of high-quality synthetic diamond crystals by μm-resolved x-ray diffractometry and topography

[+] Author Affiliations
Joanna Hoszowska, Andreas K. Freund

European Synchrotron Radiation Facility (France)

Tetsuya Ishikawa

SPring-8/RIKEN---The Institute of Physical and Chemical Research (Japan)

Jacques P. Sellschop

Univ. of the Witwatersrand (South Africa)

M. Rebak, R. C. Burns, J. O. Hansen, D. L. Welch

De Beers Diamond Research Lab. (South Africa)

C. E. Hall

Drukker International B.V. (Netherlands)

Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, 106 (November 14, 2001); doi:10.1117/12.448483
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From Conference Volume 4501

  • X-Ray Mirrors, Crystals, and Multilayers
  • Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary
  • San Diego, CA, USA | July 29, 2001

abstract

We have conducted a systematic characterization of (111)- and (100)- oriented synthetic diamond crystals comparing the best presently available specimens of two types (Ib and IIa). The samples were grown by the two major diamond producers, namely the De Beers Industrial Diamonds (Pty) Ltd. in South Africa and the Sumitomo Electric Industries Ltd. in Japan. Double-crystal x-ray diffractometry with microscopic spatial resolution and x-ray topography were employed. The type IIa crystals showed much less pronounced defect structure than the Ib crystals for the (100)- orientation, but the (111) samples were comparable. A clear correlation between the distribution of nitrogen impurities in the Ib crystals and the defect structure was observed. The rocking curve widths from small regions of all specimens were very close to theoretical values on the arcsec level, whereas for larger sample areas they were broadened due to both local defects and crystal curvature. The quality of the IIa crystals from De Beers and Sumitomo was comparable.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Joanna Hoszowska ; Andreas K. Freund ; Tetsuya Ishikawa ; Jacques P. Sellschop ; M. Rebak, et al.
"Characterization of high-quality synthetic diamond crystals by μm-resolved x-ray diffractometry and topography", Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, 106 (November 14, 2001); doi:10.1117/12.448483; http://dx.doi.org/10.1117/12.448483


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