Diffraction-limited astronomical x-ray imaging and x-ray interferometry using normal-incidence multilayer optics

David L. Windt; Steven M. Kahn; Gary E. Sommargren

doi:10.1117/12.461288

11 March 2003 Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics

David L. Windt, Steven M. Kahn, Gary E. Sommargren

Author Affiliations +

Proceedings Volume 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy; (2003) https://doi.org/10.1117/12.461288
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

We describe a new technical approach for observations of Galactic and extra-Galactic soft X-ray sources with ultra-high angular resolution. The technique is based on the use of recently developed diffraction-limited, normal-incidence mirror substrates and ultra-short-period multilayer coatings, tuned to specific bright emission lines in the range 16 < l < 40 Å, for the construction of a diffraction-limited X-ray telescope. Sub-milliarcsecond resolution could be achieved in a moderately-sized Cassegrain or prime-focus geometry, while resolution of order 0.01 microarcseconds could be achieved using a synthetic aperture X-ray interferometer constructed from an array of such telescopes spread over a 50 km baseline. We describe our technical approach in detail and outline some of the observations that would become possible with the proposed instrumentation.

Citation Download Citation

David L. Windt, Steven M. Kahn, and Gary E. Sommargren "Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); https://doi.org/10.1117/12.461288

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