Paper
22 August 2003 Smart DRM (dynamic range management) for optimal IR seeker sensitivity and dynamic range control
Hai-Wen Chen, Teresa L. P. Olson, Steven R. Frey Jr.
Author Affiliations +
Abstract
For an IR (infrared) sensor, the raw digital images coming out from the FPA (focal plane array) A/D converter contain strong non-uniformity/fixed pattern noise (FPN) as well as permanent and blinking dead pixels. Before performing the target detection and tracking functions, these raw images are processed by a CWF (chopper-wheel-free) MBPF NUC (Measurement-Based-Parametric-Fitting Non-Uniformity Correction) system to replace the dead pixels and to remove or reduce the FPN, as shown in Figure 1. The input to MBPF NUC is RIMi,j(the raw image), where 1⩽i, j⩽256, and the output is CIMi,j, the corrected image. It is important to note that as shown in Figure 1 the IT (integration time) for the FPA input capacitors is a critical parameter to control the sensor's sensitivity and temperature DR (dynamic range). From the results of our FPN measurement, the STD (standard deviation) of FPN from a raw uncorrected image can be as high as 300-400 counts. This high count FPN will severely reduce the sensor's sensitivity (we would like to detect a weak target as low as a couple of counts) and hamper the target tracking and/or ATR functions because of the high counts FPN artifacts. Therefore, the major purpose of the NUC system is to reduce FPN for early target detection, and the secondary purpose is to reduce FPN artifacts for reliable target tracking and ATR.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hai-Wen Chen, Teresa L. P. Olson, and Steven R. Frey Jr. "Smart DRM (dynamic range management) for optimal IR seeker sensitivity and dynamic range control", Proc. SPIE 5076, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIV, (22 August 2003); https://doi.org/10.1117/12.487285
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KEYWORDS
Information technology

Target detection

Nonuniformity corrections

Target recognition

Logic

Automatic target recognition

Temperature metrology

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