Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies

[+] Author Affiliations
M. De Grazia, H. Merdji, B. Carré

SPAM, CEA-Saclay (France)

J. Gaudin, G. Geoffroy, S. Guizard

LSI, CEA, Ecole Polytechnique (France)

N. Fedorov, A. Belsky, P. Martin

CELIA, CEA-CNRS, Univ. de Bordeaux I (France)

M. Kirm, V. Babin, E. Feldbach, S. Vielhauer, V. Nagirnyi

Univ. of Tartu (Estonia)

A. Vassil'ev

Moscow Lomonosov Univ. (Russia)

F. Krejci, J. Kuba

Czech Technical Univ. in Prague (Czech Republic)

J. Chalupsky

Czech Technical Univ. in Prague (Czech Republic) and Institute of Physics (Czech Republic)

J. Cihelka, V. Hajkova, M. Ledinský, L. Juha

Institute of Physics (Czech Republic)

Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860I (May 18, 2007); doi:10.1117/12.724006
Text Size: A A A
From Conference Volume 6586

  • Damage to VUV, EUV, and X-ray Optics
  • Libor Juha; Ryszard H. Sobierajski; Hubertus Wabnitz
  • Prague, Czech Republic | April 16, 2007

abstract

The new XUV sources, which deliver spatially coherent pulses of high peak power, allow to study elementary processes in the light/solid interaction in the high intensity regime (⩾1011W/cm 2). Here, we report two studies which have used high-order laser harmonics (HH) generated in gas as the excitation source. Firstly, we have investigated the dynamics of electron relaxation in the wide gap CdWO 4 dielectric crystal, an efficient scintillator material, using time-resolved luminescence spectroscopy. The kinetics decay of luminescence shows evidence of non radiative relaxation of the self-trapped excitons at the μs damage to surfaces of poly(methyl methacrylate) - PMMA, induced by a multi-shot XUV-irradiation (1 kHz reprate) for given fluence, below damage threshold range of ≈mJ/cm 2. The main processes participating in the surface modification, polymer chain scission followed by the blow up of the volatile, molecular fragments and cross-linking in the near-surface layer of remaining material, are tentatively identified and associated to, crater formation for short-time exposure (< 1min ) and surface hardening for long-time exposure (⩾1min ).

© (2007) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

M. De Grazia ; H. Merdji ; B. Carré ; J. Gaudin ; G. Geoffroy, et al.
"Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies", Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860I (May 18, 2007); doi:10.1117/12.724006; http://dx.doi.org/10.1117/12.724006


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.