Paper
30 May 2003 Digital fringe projection in 3D shape measurement: an error analysis
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Abstract
Optical 3D measurement systems are used in a lot of applications, for instance for quality control and reverse engineering. Active optical 3D measurement systems are very often based on the fringe projection technique. The key element of such a shape measurement system is the projection unit, where nowadays digital projection units based on LCD, LCoS, or DMD technology are used. Despite of a lot of opportunities these displays reveal some disadvantages for the use in fringe projection, which can reduce the phase measurement accuracy. In contrast to slide-like structures, these displays are separated in small picture elements -- so called active pixels -- with dimensions of about 8x8μm2 up to 20x20μm2. For this reason the cos function which has to be projected is spatially quantized. Therefore this function is not continuous. Another problem is the reproduction of the correct intensities given by the cos function in the projection. Usually, every projection engine shows some kind of gamma correction function or nonlinearity. This is either caused by the micro display itself or (in the case of video beamers) it is implemented into the beamer’s electronic to project proper visual images. All these effects will distort the intensity to be projected. All the mentioned effects cause phase measurement errors of different strength. Here we discuss different approaches to determine and compensate these influences of the projection engine to the 3D measurement. If the compensation is well accomplished, the accuracy of the measurement results may increase by up to one magnitude.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georg H. Notni and Gunther Notni "Digital fringe projection in 3D shape measurement: an error analysis", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.500618
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Cited by 54 scholarly publications and 2 patents.
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KEYWORDS
Cameras

Quantization

Projection systems

3D metrology

Phase measurement

Fringe analysis

Error analysis

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