Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR

R. Cristescu; Gabriel Socol; Ion N. Mihailescu; Ion G. Morjan; Iulia Soare; Mihai A. Popescu; F. Sava; C. O. Morosanu; I. Stamatin; A. Andrei; Johny Neamtu

doi:10.1117/12.537509

14 November 2003 Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR

R. Cristescu, Gabriel Socol, Ion N. Mihailescu, Ion G. Morjan, Iulia Soare, Mihai A. Popescu, F. Sava, C. O. Morosanu, I. Stamatin, A. Andrei, Johny Neamtu

Author Affiliations +

Proceedings Volume 5147, ALT'02 International Conference on Advanced Laser Technologies; (2003) https://doi.org/10.1117/12.537509
Event: ALT'02 International Conference on Advanced laser Technologies, 2002, Adelboden, Switzerland

Abstract

We report the obtaining of thin organic films based on poly(methyl methacrylate) polymer by Pulsed Laser Deposition on silicon substrates and quartz slides. The films were characterized by complementary techniques: x-ray Diffraction, x-ray Photoelectron Spectroscopy, Atomic Force Microscopy, Optical Microscopy, Raman Spectroscopy and Fourier Transform Infrared Spectroscopy. The obtained structures are amorphous. The film composition and structure depend on both the laser fluence as well as on the temperature of the substrate during deposition. We put in evidence in freshly deposited films the presence of diamond-like carbon while its amount strongly increases by annealing at ~400°C in Argon atmosphere.

Citation Download Citation

R. Cristescu, Gabriel Socol, Ion N. Mihailescu, Ion G. Morjan, Iulia Soare, Mihai A. Popescu, F. Sava, C. O. Morosanu, I. Stamatin, A. Andrei, and Johny Neamtu "Pulsed laser deposition of poly(methyl methacrylate) thin films: experimental evidence by XRD, XPS, AFM, optical microscopy, Raman spectroscopy, and FTIR", Proc. SPIE 5147, ALT'02 International Conference on Advanced Laser Technologies, (14 November 2003); https://doi.org/10.1117/12.537509

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available