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Proceedings Article

An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers

[+] Author Affiliations
Benjawan Kjornrattanawanich

Brookhaven National Lab. (USA)

Regina Soufli, Sasa Bajt

Lawrence Livermore National Lab. (USA)

David L. Windt

Columbia Astrophysics Lab. (USA)

John F. Seely

Naval Research Lab. (USA)

Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, 17 (October 14, 2004); doi:10.1117/12.560465
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From Conference Volume 5538

  • Optical Constants of Materials for UV to X-Ray Wavelengths
  • Regina Soufli; John F. Seely
  • Denver, CO | August 02, 2004

abstract

We have produced and characterized Mo/Y multilayers designed as linear-polarizers for use near λ ~ 8 nm. By depositing these films directly onto silicon photodiodes, we are able to measure both reflectance and transmittance in the EUV using synchrotron radiation. These measurements have been used to access the accuracy of yttrium optical constants in this wavelength range. We describe our experimental results and discuss the prospects for the future development of efficient EUV polarization elements.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Benjawan Kjornrattanawanich ; Regina Soufli ; Sasa Bajt ; David L. Windt and John F. Seely
"An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers", Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, 17 (October 14, 2004); doi:10.1117/12.560465; http://dx.doi.org/10.1117/12.560465


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