Paper
6 December 2005 An integrated measurement system of the extinction ratio and half-wave voltage of crystal and the phase-retardation of a wave plate
Author Affiliations +
Proceedings Volume 6049, Optomechatronic Sensors and Instrumentation; 60490Q (2005) https://doi.org/10.1117/12.648319
Event: Optomechatronic Technologies 2005, 2005, Sapporo, Japan
Abstract
An integrated and automated measurement system of the static extinction ratio of crystal, the static or dynamic extinction ratio and half wave voltage of electro-optic crystal and the phase retardation of a wave plate is studied. By using the interferometric technology of polarized light, the pulse-modulated light source, the demodulation circuit and the division routine in computer program, the system effectively combines optics, mechanics and electronics technologies with computer control technology, which can be used to measure the above-mentioned three parameters fast, synthetically and automatically not only for laboratory research but also for product line. The results prove that with the measurement theory and the method of the paper, the extinction ratio of crystal can be measured to 10-6 , and the repeat accuracy of the phase retardation of a wave plate can be measured to excel 0.3° ; moreover, by using the longitudinal modulation technology of the electro-optic crystal, the half-wave voltage of crystal can be measured accurately.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Feng Bo and Jian-qiang Zhu "An integrated measurement system of the extinction ratio and half-wave voltage of crystal and the phase-retardation of a wave plate", Proc. SPIE 6049, Optomechatronic Sensors and Instrumentation, 60490Q (6 December 2005); https://doi.org/10.1117/12.648319
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KEYWORDS
Crystals

Wave plates

Light sources

Polarization

Electro optics

Phase measurement

Computing systems

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