X-pinch source size measurements

Sergei A Pikuz; ByungMoo Song; Tatyana A Shelkovenko; Katherine M Chandler; Marc D. Mitchell; David A. Hammer

doi:10.1117/12.508752

7 January 2004 X-pinch source size measurements

Sergei A Pikuz, ByungMoo Song, Tatyana A Shelkovenko, Katherine M Chandler, Marc D. Mitchell, David A. Hammer

Proceedings Volume 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications; (2004) https://doi.org/10.1117/12.508752
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

The X pinch plasma emits subnanosecond bursts of x-rays in the 3 - 10 keV energy range from a very small source. As such, it has been used for high-resolution point-projection imaging of small, dense, rapidly changing plasmas, as well as submillimeter thick biological samples. The very small x-ray source size of the X pinch provides high spatial coherence of the x-rays, enabling the X pinch to be used for imaging low absorption, low contrast objects with excellent spatial resolution by incorporating wave-optics effects. The reverse procedure has been used to determine the X pinch x-ray source size: well-defined micro-fabricated slits were imaged by point-projection radiography, and the detailed patterns were compared with wave-optics calculations of the expected image patterns on film as a function of x-ray source size and energy band. In addition, an x-ray streak camera was used to study the X pinch source size as a function of time. Dynamic shadow images of a boron fiber with a tungsten core and glass fiber sheathed in plastic were compared with a time-integrated radiographic image. Source sizes as small as 1.2 μm (full width at half maximum, assuming a Gaussian spatial intensity profile for the source) have been inferred.

Citation Download Citation

Sergei A Pikuz, ByungMoo Song, Tatyana A Shelkovenko, Katherine M Chandler, Marc D. Mitchell, and David A. Hammer "X-pinch source size measurements", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); https://doi.org/10.1117/12.508752

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