S-transform analysis of projected fringe patterns

Özlem Kocahan; Serhat Özder; Emre Coşkun

doi:10.1117/12.725786

18 June 2007 S-transform analysis of projected fringe patterns

Özlem Kocahan, Serhat Özder, Emre Coşkun

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 66161A (2007) https://doi.org/10.1117/12.725786
Event: Optical Metrology, 2007, Munich, Germany

Abstract

3D profile measurement of an object is studied experimentally by using a standard fringe projection technique consisting of a CCD camera and a digital projector. The height profile of the object is calculated through the phase change distribution of the projected fringes with two dimensional fringe pattern by introducing the carrier frequencies in two spatial directions, x and y. The phase distribution is extracted from the optical fringe pattern by using S-transform gradient and S-transform phase methods. Experimental result for the Fourier transform profilometry algorithm is compared with the results of the S-transform analysis.

Citation Download Citation

Özlem Kocahan, Serhat Özder, and Emre Coşkun "S-transform analysis of projected fringe patterns", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161A (18 June 2007); https://doi.org/10.1117/12.725786

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available