Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Infrared Electronic speckle pattern interferometry at 10 μm

[+] Author Affiliations
J.-F. Vandenrijt, M. Georges

Univ. de Liège (Belgium)

Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162Q (June 18, 2007); doi:10.1117/12.726232
Text Size: A A A
From Conference Volume 6616

  • Optical Measurement Systems for Industrial Inspection V
  • Wolfgang Osten; Christophe Gorecki; Erik L. Novak
  • Munich, Germany | June 18, 2007

abstract

Demonstration of electronic speckle pattern interferometry of opaque scattering objects at 10 μm wavelength using a commercial thermal-camera is presented for the first time to our knowledge. The idea of using a wavelength longer than the usual visible ones is to render such holographic displacement measurement techniques less sensitive to external perturbations. We discuss some particular aspects of the increase in wavelength to the 10 μm thermal range. We then show results of in-plane measurement of the rotation of a metallic plate. We applied the phase-shifting technique for quantitative measurements and the results are correlated to countermeasurements with a theodolite.

© (2007) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

J.-F. Vandenrijt and M. Georges
"Infrared Electronic speckle pattern interferometry at 10 μm", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162Q (June 18, 2007); doi:10.1117/12.726232; http://dx.doi.org/10.1117/12.726232


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.