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Proceedings Article

Infrared Electronic speckle pattern interferometry at 10 μm

[+] Author Affiliations
J.-F. Vandenrijt, M. Georges

Univ. de Liège (Belgium)

Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162Q (June 18, 2007); doi:10.1117/12.726232
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From Conference Volume 6616

  • Optical Measurement Systems for Industrial Inspection V
  • Wolfgang Osten; Christophe Gorecki; Erik L. Novak
  • Munich, Germany | June 18, 2007

abstract

Demonstration of electronic speckle pattern interferometry of opaque scattering objects at 10 μm wavelength using a commercial thermal-camera is presented for the first time to our knowledge. The idea of using a wavelength longer than the usual visible ones is to render such holographic displacement measurement techniques less sensitive to external perturbations. We discuss some particular aspects of the increase in wavelength to the 10 μm thermal range. We then show results of in-plane measurement of the rotation of a metallic plate. We applied the phase-shifting technique for quantitative measurements and the results are correlated to countermeasurements with a theodolite.

© (2007) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

J.-F. Vandenrijt and M. Georges
"Infrared Electronic speckle pattern interferometry at 10 μm", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162Q (June 18, 2007); doi:10.1117/12.726232; http://dx.doi.org/10.1117/12.726232


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