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Proceedings Article

Fast MTF measurement of CMOS imagers using ISO 12333 slanted-edge methodology

[+] Author Affiliations
Magali Estribeau, Pierre Magnan

SUPAERO (France)

Proc. SPIE 5251, Detectors and Associated Signal Processing, 243 (February 19, 2004); doi:10.1117/12.513320
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From Conference Volume 5251

  • Detectors and Associated Signal Processing
  • Jean-Pierre Chatard; Peter N. J. Dennis
  • St. Etienne, France | September 30, 2003

abstract

The ISO 12233 standard provides a fast and efficient way of measuring Modulation Transfer Function (MTF) of digital input devices (such a digital still camera) using a normalized reflective target based on a slanted-edge method. A similar methodology has been applied for measuring MTF of CMOS image sensors, using 12233 slanted-edge technique associated with a prototype transmissive target. In order to validate the results, comparisons have been made between MTF measurements of image sensor implemented using a 0.25 μm process, using this method and sine target direct measurements.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Magali Estribeau and Pierre Magnan
"Fast MTF measurement of CMOS imagers using ISO 12333 slanted-edge methodology", Proc. SPIE 5251, Detectors and Associated Signal Processing, 243 (February 19, 2004); doi:10.1117/12.513320; http://dx.doi.org/10.1117/12.513320


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