Paper
26 February 2004 Transmission deflectometer for high-range lens slope measurement
Lingli Wang, Arno Ras, Willem Potze, Peter van de Goor
Author Affiliations +
Abstract
A new lens slope measurement system is developed and realized in the Philips CFT laboratory, which is named a transmission deflectometer. The slopes of two lenses are measured with this measurement system. A high measurement accuracy, 0.05 mrad, over a wide measurement range of ± 17° could be reached.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lingli Wang, Arno Ras, Willem Potze, and Peter van de Goor "Transmission deflectometer for high-range lens slope measurement", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.512937
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KEYWORDS
Mirrors

Objectives

Calibration

Error analysis

Distortion

3D metrology

Reflectivity

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