Paper
28 February 2006 Ultra-high resolution polarization sensitive transversal optical coherence tomography for structural analysis and strain mapping
Karin Wiesauer, Michael Pircher, Erich Goetzinger, Christoph K. Hitzenberger, Rainer Engelke, Gisela Ahrens, Karl Pfeiffer, Ute Ostrzinski, Gabi Gruetzner, Reinhold Oster, David Stifter
Author Affiliations +
Abstract
Optical coherence tomography (OCT) is a contactless and non-invasive technique nearly exclusively applied for bio-medical imaging of tissues. Besides the internal structure, additionally strains within the sample can be mapped when OCT is performed in a polarization sensitive (PS) way. In this work, we demonstrate the benefits of PS-OCT imaging for non-biological applications. We have developed the OCT technique beyond the state-of-the-art: based on transversal ultra-high resolution (UHR-)OCT, where an axial resolution below 2 μm within materials is obtained using a femtosecond laser as light source, we have modified the setup for polarization sensitive measurements (transversal UHR-PS-OCT). We perform structural analysis and strain mapping for different types of samples: for a highly strained elastomer specimen we demonstrate the necessity of UHR-imaging. Furthermore, we investigate epoxy waveguide structures, photoresist moulds for the fabrication of micro-electromechanical parts (MEMS), and the glass-fibre composite outer shell of helicopter rotor blades where cracks are present. For these examples, transversal scanning UHR-PS-OCT is shown to provide important information about the structural properties and the strain distribution within the samples.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karin Wiesauer, Michael Pircher, Erich Goetzinger, Christoph K. Hitzenberger, Rainer Engelke, Gisela Ahrens, Karl Pfeiffer, Ute Ostrzinski, Gabi Gruetzner, Reinhold Oster, and David Stifter "Ultra-high resolution polarization sensitive transversal optical coherence tomography for structural analysis and strain mapping", Proc. SPIE 6108, Commercial and Biomedical Applications of Ultrafast Lasers VI, 61080K (28 February 2006); https://doi.org/10.1117/12.643769
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KEYWORDS
Optical coherence tomography

Waveguides

Polarization

Microelectromechanical systems

Interfaces

Birefringence

Epoxies

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