Paper
12 July 2007 Phase reconstruction by multiple plane detection for holographic microscopy
Author Affiliations +
Abstract
Inline holographic microscopy is known as a technique for absolute phase retrieval. Any distortion of the needed reference wave, e.g. from the surfaces of a test slide, causes reconstruction errors. We apply a multi plane detection technique, which generates the same information as a hologram but does not use any reference wave. The technique was demonstrated for microscopic resolution in case of amplitude objects [1], [2]. This paper focuses on imaging and reconstruction of phase objects. The technique is experimentally applied to a Pleurosigma test chart and a phase test standard. Objects with a phase step of π/3 and lateral structure sizes of 2 μm are well resolved.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexej Grjasnow, Rainer Riesenberg, and Andreas Wuttig "Phase reconstruction by multiple plane detection for holographic microscopy", Proc. SPIE 6630, Confocal, Multiphoton, and Nonlinear Microscopic Imaging III, 66300J (12 July 2007); https://doi.org/10.1117/12.727877
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Cited by 1 scholarly publication.
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KEYWORDS
Diffraction

Holography

Microscopes

Microscopy

Distance measurement

Distortion

Phase shift keying

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