Paper
19 May 2006 Digital realization of precision surface defect evaluation system
Fengquan Wang, Yongying Yang, Dandan Sun, Liming Yang, Ruijie Li
Author Affiliations +
Abstract
The automatic inspection of surface imperfections of precise elements is a durable problem expected to be solved. These goals require the use of objective methods to automatic inspection of surface imperfections. Based on the defects image which are light in dark background in scattering imaging system, a complete digital evaluation system of surface imperfections, is presented in this paper. Using the XY- scanning system to detect sub-aperture, digital image could be stitched based on isometric serial images. Implementing binary image segmentation and marginal test, feature extraction by using erosion and dilation algorithm was studied. In this system, the lateral resolution is approximately 1μm. The results provide theoretical and practical evidence to establish the precise surface imperfections evaluation system.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fengquan Wang, Yongying Yang, Dandan Sun, Liming Yang, and Ruijie Li "Digital realization of precision surface defect evaluation system", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500F (19 May 2006); https://doi.org/10.1117/12.677979
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image processing

Image segmentation

Light scattering

Digital imaging

Inspection

Scattering

Binary data

Back to Top