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Proceedings Article

Silicon photonics technology: past, present, and future

[+] Author Affiliations
Richard Soref

Air Force Research Lab. (USA)

Proc. SPIE 5730, Optoelectronic Integration on Silicon II, 19 (March 14, 2005); doi:10.1117/12.585284
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From Conference Volume 5730

  • Optoelectronic Integration on Silicon II
  • Joel A. Kubby; Ghassan E. Jabbour
  • San Jose, California, United States | January 22, 2005

abstract

Due to recent investments by government and industry, silicon-based photonics has a chance of becoming "the" mainstream photonics technology. This paper presents a survey of recent results found in journal articles and conference proceedings. Emerging trends in silicon-based photonic components (waveguides, ultrafast modulators, switches, light sources, detectors, direct bandgap SiGeSn/GeSn devices, photonic-crystal and plasmonic devices) are identified and discussed. In principle, Si PICs and OEICs can operate anywhere within the 0.3 to 100 μm wavelength range -- enabling transceivers, on-chip processing, and interfacing with fibers or free-space light beams. Thus, in addition to the very important 1.55 μm telecomm applications, there are significant Si photonic opportunities throughout the infrared-and-visible spectrum. The push towards smarter, ever-denser on-chip photonic networks, drives a "convergence" of micro-, nano- and plasmo-photonic techniques for progressively smaller devices (Moore"s law for photonics) and for improved functionality of modulators, switches, emitters, detectors, waveguides, resonators, tapers and filters. This convergence includes composite components: monolithic integration of microstrip waveguides, 2D and 3D photonic-crystal elements and metal/Si plasmon-optics that ultilize buried or surface-mounted 2D arrays of metal stripes or nanodots.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Richard Soref
"Silicon photonics technology: past, present, and future", Proc. SPIE 5730, Optoelectronic Integration on Silicon II, 19 (March 14, 2005); doi:10.1117/12.585284; http://dx.doi.org/10.1117/12.585284


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