Paper
21 April 2006 Noise in MgB2 thin film: a candidate material for space-borne infrared detector development
B. Lakew, S. Aslam, H. Jones, B. Moeckly
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Abstract
An MgB2 thin film was grown on a SiN-Si substrate, with a superconducting transition temperature, Tc, near 39K. At the mid-point of the transition (T= 38.24K) and at 10Hz a noise spectral density SV = 0.34nV/ √Hz was measured. The temperature noise, Kn, of the MgB2 film at different frequencies is compared to that of cuprate high temperature superconducting (HTS) thin films (with Tc ~ 90 K) used currently in transition-edge bolometers. Κn values predict that high performance far-IR thermal detectors (i.e bolometers) can be developed using MgB2 as a thermistor.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Lakew, S. Aslam, H. Jones, and B. Moeckly "Noise in MgB2 thin film: a candidate material for space-borne infrared detector development", Proc. SPIE 6186, MEMS, MOEMS, and Micromachining II, 61860A (21 April 2006); https://doi.org/10.1117/12.663668
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KEYWORDS
Thin films

Superconductors

Bolometers

Silicon

Infrared detectors

Resistance

Temperature metrology

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