Ultra-precise distance measurement for nanometrology

Ondrej Cip D.V.M.; Frantisek Petru; Zdenek Buchta; Josef Lazar

doi:10.1117/12.545924

10 September 2004 Ultra-precise distance measurement for nanometrology

Ondrej Cip D.V.M., Frantisek Petru, Zdenek Buchta, Josef Lazar

Proceedings Volume 5457, Optical Metrology in Production Engineering; (2004) https://doi.org/10.1117/12.545924
Event: Photonics Europe, 2004, Strasbourg, France

Abstract

We present experimental results achieved by a method of direct conversion of the relative changes of the measurement optical path of Michelson interferometer to relative changes of the resonant optical-frequency of Fabry-Perot (F.-P.) resonator. We developed the method as a testing process for verification of scale-linearity of Michelson interferometer with total resolution 0,3 nm. The method consists of a mechanical coupled shift of the corner cube mirror of the interferometer measurement arm with one of the mirrors of F.-P. resonator. A piezoelectric transducer (PZT) with approximately 10 microns elongation drives that mechanical shift. An external tunable laser source at 633 nm wavelength provides identification of one of the resonant optical frequency of F.-P. resonator by the frequency locking mechanism with synchronous detection technique in the servo loop feedback. Because definition of the meter unit is based on iodine stabilized He-Ne laser, then the optical frequency of the locked tunable laser is frequency compared with HeNeI₂ laser by the heterodyne optical mixing. A fast high-resolution counter counts the resultant radio-frequency signal as a product of the optical mixing. Measured frequency values and values of interference phase acquired by the interferometer are simultaneously sampled step by step for each elongation position of PZT element. The experimental data achieved by F.-P. resonator shows uncertainty of the relative distance change better than 0,01 nm. We verified the scale-linearity of Michelson interferometer to ±1,0 nm limit.

Citation Download Citation

Ondrej Cip D.V.M., Frantisek Petru, Zdenek Buchta, and Josef Lazar "Ultra-precise distance measurement for nanometrology", Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); https://doi.org/10.1117/12.545924

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