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Proceedings Article

Resonant grating effects at terahertz frequencies

[+] Author Affiliations
Emmanuel Bonnet, Alain Cachard, Alexandre V. Tishchenko, Olivier M. Parriaux

Univ. Jean Monnet/Saint-Etienne (France)

Frederic Garet, Jean-Louis Coutaz

Univ. de Savoie (France)

Georges-Andre Racine

Ecole Polytechnique Federale de Lausanne (Switzerland)

Proc. SPIE 5466, Microwave and Terahertz Photonics, 80 (September 1, 2004); doi:10.1117/12.547447
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From Conference Volume 5466

  • Microwave and Terahertz Photonics
  • Andreas Stohr; Dieter Jager; Stavros Iezekiel
  • Strasbourg, France | April 26, 2004

abstract

Narrow band resonant reflection of a polarized focused beam from a single-crystal silicon grid is demonstrated at terahertz frequencies with an efficiency close to 100 %. A spectral width of less than 7 μm at a resonance wavelength of 570 μm is achieved with a 4 mm-waist beam which overlaps with only ~10 grid periods. This compact reflection filter is a scale model of what can be expected at optical frequencies, but also represents a new type of compact terahertz device.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Emmanuel Bonnet ; Alain Cachard ; Alexandre V. Tishchenko ; Olivier M. Parriaux ; Frederic Garet, et al.
"Resonant grating effects at terahertz frequencies", Proc. SPIE 5466, Microwave and Terahertz Photonics, 80 (September 1, 2004); doi:10.1117/12.547447; http://dx.doi.org/10.1117/12.547447


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