Paper
1 September 2004 Resonant grating effects at terahertz frequencies
Emmanuel Bonnet, Alain Cachard, Alexandre V. Tishchenko, Olivier M. Parriaux, Frederic Garet, Jean-Louis Coutaz, Georges-Andre Racine
Author Affiliations +
Abstract
Narrow band resonant reflection of a polarized focused beam from a single-crystal silicon grid is demonstrated at terahertz frequencies with an efficiency close to 100 %. A spectral width of less than 7 μm at a resonance wavelength of 570 μm is achieved with a 4 mm-waist beam which overlaps with only ~10 grid periods. This compact reflection filter is a scale model of what can be expected at optical frequencies, but also represents a new type of compact terahertz device.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emmanuel Bonnet, Alain Cachard, Alexandre V. Tishchenko, Olivier M. Parriaux, Frederic Garet, Jean-Louis Coutaz, and Georges-Andre Racine "Resonant grating effects at terahertz frequencies", Proc. SPIE 5466, Microwave and Terahertz Photonics, (1 September 2004); https://doi.org/10.1117/12.547447
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Waveguides

Terahertz radiation

Silicon

Diffraction gratings

Signal detection

Semiconducting wafers

Optical filters

Back to Top