Paper
8 January 2008 Performance analysis of 256 element linear 2.4μm InGaAs photovoltaic detector arrays
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Abstract
In this work, the performance of InxGa1-xAs photovoltaic detectors with cutoff wavelength of 2.4μm(x=0.78) were investigated. The detector arrays were fabricated using gas source molecular beam epitaxy (GSMBE) grown material and arranged in linear arrays of 256 pixels of 56×56μm2 dimension. The transition of the large lattice mismatch (1.6%) between the substrate and the absorption layer was dealt with a linearity transformation InxGa1-xAs buffer layer. The dark-current performance achieved is as low as 10-10A at 300K and a bias voltage of -0.5V. This corresponds to a figure of merit for detector resistance R0 times detector pixel area A of R0A =3.5~7.5Ωcm2 at 300K and quantum efficiency above 60%. Room temperature D*(λp) values beyond 3×1010cmHz1/2W-1.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kefeng Zhang, Hengjing Tang, Xiaoli Wu, Xue Li, Yonggang Zhang, and Haimei Gong "Performance analysis of 256 element linear 2.4μm InGaAs photovoltaic detector arrays", Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 683506 (8 January 2008); https://doi.org/10.1117/12.755774
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KEYWORDS
Indium gallium arsenide

Sensors

Detector arrays

Resistance

Semiconducting wafers

Photodiodes

Photovoltaic detectors

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