A CMOS-based large-area high-resolution imaging system for high-energy x-ray applications

Brian Rodricks; Boyd Fowler; Chiao Liu; John Lowes; Dean Haeffner; Ulrich Lienert; John Almer

doi:10.1117/12.795449

5 September 2008 A CMOS-based large-area high-resolution imaging system for high-energy x-ray applications

Brian Rodricks, Boyd Fowler, Chiao Liu, John Lowes, Dean Haeffner, Ulrich Lienert, John Almer

Proceedings Volume 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X; 707914 (2008) https://doi.org/10.1117/12.795449
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

CCDs have been the primary sensor in imaging systems for x-ray diffraction and imaging applications in recent years. CCDs have met the fundamental requirements of low noise, high-sensitivity, high dynamic range and spatial resolution necessary for these scientific applications. State-of-the-art CMOS image sensor (CIS) technology has experienced dramatic improvements recently and their performance is rivaling or surpassing that of most CCDs. The advancement of CIS technology is at an ever-accelerating pace and is driven by the multi-billion dollar consumer market. There are several advantages of CIS over traditional CCDs and other solid-state imaging devices; they include low power, high-speed operation, system-on-chip integration and lower manufacturing costs. The combination of superior imaging performance and system advantages makes CIS a good candidate for high-sensitivity imaging system development. This paper will describe a 1344 x 1212 CIS imaging system with a 19.5μm pitch optimized for x-ray scattering studies at high-energies. Fundamental metrics of linearity, dynamic range, spatial resolution, conversion gain, sensitivity are estimated. The Detective Quantum Efficiency (DQE) is also estimated. Representative x-ray diffraction images are presented. Diffraction images are compared against a CCD-based imaging system.

Citation Download Citation

Brian Rodricks, Boyd Fowler, Chiao Liu, John Lowes, Dean Haeffner, Ulrich Lienert, and John Almer "A CMOS-based large-area high-resolution imaging system for high-energy x-ray applications", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 707914 (5 September 2008); https://doi.org/10.1117/12.795449

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available