Simultaneous phase-shifting interferometry based on high-speed CCD

Fen Zuo; Lei Chen; Chunsheng Xu

doi:10.1117/12.725441

17 January 2007 Simultaneous phase-shifting interferometry based on high-speed CCD

Fen Zuo, Lei Chen, Chunsheng Xu

Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62795N (2007) https://doi.org/10.1117/12.725441
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China

Abstract

A new simultaneous phase-shifting measuring method based on Twyman-Green polarization phase- shifting technique is presented. In the corresponding set-up, a 2-dimentional grating is applied. By the grating, 4 diffracted beams of (±1, ±1) orders are formed for the same diffracting efficiency. Each is let to pass one of four polarizing plates respectively, polarization directions of which differ in turn by 45°. So four interferograms with 90°phase-shifting interval are frozen simultaneously by a high-speed CCD, which has short exposure of 1/10000 s. Moreover, by the use of 4-bucket algorithm, a profile of the test surface is thus derived. Meantime, the system is deposited on a vibration-isolate flat, and the structure of an ordinary piezoelectric transducer (PZT), with a time response above 1000 Hz at amplitude of &lgr;/2, is used to simulate an epicenter, the frequency of which varying from 10 Hz to 200 Hz. In addition, the experimental results reveal that the advanced system has a high testing precision and testing repeatability in the vibrational environment whose amplitude- frequency product is less than 100 Wave-Hertz. Therefore, the proposed system has enough endurance to the vibration during on-line optical testing.

Citation Download Citation

Fen Zuo, Lei Chen, and Chunsheng Xu "Simultaneous phase-shifting interferometry based on high-speed CCD", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62795N (17 January 2007); https://doi.org/10.1117/12.725441

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KEYWORDS

Phase shifts

Charge-coupled devices

Interferometers

Phase interferometry

Polarization

Optical testing

Ferroelectric materials

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