Paper
29 August 2006 Transmittance and reflective coatings for the 50-200-nm spectral range
Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez, José A. Méndez
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Abstract
This proceeding reviews the performance of a far-extreme ultraviolet (FUV-EUV) reflectometer-deposition system available at GOLD-Instituto de Fisica Aplicada, CSIC and the different sorts of coatings for the EUV that can be prepared with this equipment. Coatings both for wavelengths longer and shorter than the LiF/MgF2 cutoff wavelengths are prepared. Regarding coatings above these cutoffs, they are based in the combination of Al and MgF2. High reflectance coatings of Al protected with MgF2 can be prepared with a reflectance of ~80% at the H Lyman α line at 121.6 nm. Narrowband transmittance filters based on (Al/MgF2)n are also deposited, with a high peak transmittance down to wavelengths as short as 121.6 nm. Regarding coatings for wavelengths shorter than the fluoride cutoffs, wideband reflective coatings based on a single layer of SiC and also on Al/MgF2/SiC multilayers are prepared with a high reflectance at wavelengths longer than ~80 nm. In addition to the above coatings, a plan for the deposition in the near future of narrowband reflective coatings tuned at wavelengths as long as 95 nm (but shorter than the LiF cutoff) is discussed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez, and José A. Méndez "Transmittance and reflective coatings for the 50-200-nm spectral range", Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 63170L (29 August 2006); https://doi.org/10.1117/12.680987
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Cited by 2 scholarly publications.
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KEYWORDS
Reflectivity

Silicon carbide

Transmittance

Aluminum

Multilayers

Optical coatings

Thin film coatings

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