CdTe and Cd0.9Zn0.1Te crystal growth and characterization for nuclear spectrometers

Krishna C. Mandal; Sung Hoon Kang; Michael Choi; Gomez Wright; Gerald E. Jellison Jr.

doi:10.1117/12.683802

14 September 2006 CdTe and Cd_0.9Zn_0.1Te crystal growth and characterization for nuclear spectrometers

Krishna C. Mandal, Sung Hoon Kang, Michael Choi, Gomez Wright, Gerald E. Jellison Jr.

Proceedings Volume 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII; 63190X (2006) https://doi.org/10.1117/12.683802
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Large volume single crystals of CdTe and Cd_0.9Zn_0.1Te (CZT) have been grown by a controlled vertical Bridgman technique using in-house zone refined precursors and characterized through structural, electrical, optical, and spectroscopic methods. The grown crystals (diameter greater than or equal to 2.5 cm and length >10 cm) have shown promising characteristics for high-resolution room temperature solid-state radiation detectors due to their high resistivity (~1010 Ω-cm for CdTe, and >1011 Ω-cm for CZT) and good charge transport properties [μτ_e ~ (2-5)x10-3 cm²/V]. The fabricated detectors in planar single element and Frisch collar configurations have shown very low leakage currents and high count rates for various sources, including Am-241, and Cs-137. The grown crystals have been further characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), and transmission two-modulator generalized ellipsometry (2-MGE). Details of the CdTe and CZT characterization results, detector fabrication steps, and testing with radiation sources are presented. The CdTe and CZT crystals have shown high prospects for low power rating solid-state nuclear spectrometers and medical imaging devices.

Citation Download Citation

Krishna C. Mandal, Sung Hoon Kang, Michael Choi, Gomez Wright, and Gerald E. Jellison Jr. "CdTe and Cd_0.9Zn_0.1Te crystal growth and characterization for nuclear spectrometers", Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63190X (14 September 2006); https://doi.org/10.1117/12.683802

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available