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Proceedings Article

Study of active width-reduced line-defect photonic crystal waveguides for high speed applications

[+] Author Affiliations
Yongbo Tang, Bowen Wang

The Royal Institute of Technology (Sweden) and Zhejiang Univ. (China)

Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71350R (November 18, 2008); doi:10.1117/12.804275
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From Conference Volume 7135

  • Optoelectronic Materials and Devices III
  • Yi Luo; Jens Buus; Fumio Koyama; Yu-Hwa Lo
  • Hangzhou, China | October 26, 2008

abstract

We study the electrical and optical characteristic of the width-reduced line-defect photonic crystal waveguides with lateral p-i-n structures on Silicon-on-Insulator substrates. A longitudinal-section-based electrical model is built to take the holes into consideration. Compared with the classical line-defect photonic crystal waveguides, the width reduced photonic crystal waveguide has much stronger capacity in optical confinement in plane, which can allow a narrower intrinsic layer that leads to a fast electric response.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Yongbo Tang and Bowen Wang
"Study of active width-reduced line-defect photonic crystal waveguides for high speed applications", Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71350R (November 18, 2008); doi:10.1117/12.804275; http://dx.doi.org/10.1117/12.804275


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