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Proceedings Article

Uncooled amorphous silicon XGA IRFPA with 17μm pixel-pitch for high end applications

[+] Author Affiliations
B. Fieque, P. Robert, C. Minassian, M. Vilain, J. L. Tissot, A. Crastes, O. Legras, J. J. Yon

ULIS - BP27 (France)

Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 69401X (April 17, 2008); doi:10.1117/12.779488
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From Conference Volume 6940

  • Infrared Technology and Applications XXXIV
  • Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton
  • Orlando, FL | March 16, 2008

abstract

The high level of accumulated expertise by ULIS and CEA/LETI on uncooled microbolometers made from amorphous silicon enables ULIS to develop 1024 x 768 (XGA) IRFPAs with 17 μm pixel-pitch to build up the currently available product catalog. This detector has kept all the innovations developed on the full TV format Read Out Integrated Circuit (ROIC) (detector configuration by serial link, two video outputs, low power consumption and wide electrical dynamic range ...). The specific appeal of this unit lies in the high image resolution it provides. The reduction of the pixel-pitch turns this XGA array into a product well adapted for high resolution and compact systems. In the last part of the paper, we will look more closely at high electro-optical performances of this IRFPA; we will highlight the wide thermal dynamic range as well as the high characteristics uniformity and high pixel operability achieved thanks to the mastering of the amorphous silicon technology coupled with the ROIC design.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

B. Fieque ; P. Robert ; C. Minassian ; M. Vilain ; J. L. Tissot, et al.
"Uncooled amorphous silicon XGA IRFPA with 17μm pixel-pitch for high end applications", Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 69401X (April 17, 2008); doi:10.1117/12.779488; http://dx.doi.org/10.1117/12.779488


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