Fault protection of broad-area laser diodes

J. H. Jacob; R. Petr; M. A. Jaspan; S. D. Swartz; M. T. Knapczyk; A. M. Flusberg; A. K. Chin; I. Smilanski

doi:10.1117/12.807717

23 February 2009 Fault protection of broad-area laser diodes

J. H. Jacob, R. Petr, M. A. Jaspan, S. D. Swartz, M. T. Knapczyk, A. M. Flusberg, A. K. Chin, I. Smilanski

Proceedings Volume 7198, High-Power Diode Laser Technology and Applications VII; 719815 (2009) https://doi.org/10.1117/12.807717
Event: SPIE LASE: Lasers and Applications in Science and Engineering, 2009, San Jose, California, United States

Abstract

Detailed reliability studies of high-power, CW, broad-area, GaAs-based laser- diodes were performed. Optical and electrical transients occurring prior to device failure by catastrophic optical-damage (COD) were observed. These transients were correlated with COD formation as observed in laser diodes with an optical window in the n-side electrode. In addition, custom electronics were designed to fault-protect the laser diodes during aging tests, i.e. each time a transient (fault) was detected, the operating current was temporarily cut off within 4μs of fault detection. The lifetime of fault-protected 808-nm laser-diode bars operated at a constant current of 120A (~130W) and 35°C exceeded similar unprotected devices by factors of 2.

Citation Download Citation

J. H. Jacob, R. Petr, M. A. Jaspan, S. D. Swartz, M. T. Knapczyk, A. M. Flusberg, A. K. Chin, and I. Smilanski "Fault protection of broad-area laser diodes", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 719815 (23 February 2009); https://doi.org/10.1117/12.807717

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