Double-negative metamaterial optical waveguide behavior subjected to stress

H. J. El-Khozondar; R. J. El-Khozondar; M. M. Shabat

doi:10.1117/12.780734

6 May 2008 Double-negative metamaterial optical waveguide behavior subjected to stress

H. J. El-Khozondar, R. J. El-Khozondar, M. M. Shabat

Proceedings Volume 6987, Metamaterials III; 69871W (2008) https://doi.org/10.1117/12.780734
Event: SPIE Photonics Europe, 2008, Strasbourg, France

Abstract

Stress effect on the behavior of optical waveguide sensor consists of dielectric slab inserted between metamaterial (MTM) cladding and substrate is investigated by using numerical calculations. Several MTMs with different values of ε and μ with ε μ = 4 are chosen in order to clarify the variation of stress effect with respect to the material constants. Numerical calculations of the effective index for both transverse electric modes (TE) and transverse magnetic modes (TM) as a function of stress and slab thickness have been performed. It is found that stress affects the performance of the waveguide sensor.

Citation Download Citation

H. J. El-Khozondar, R. J. El-Khozondar, and M. M. Shabat "Double-negative metamaterial optical waveguide behavior subjected to stress", Proc. SPIE 6987, Metamaterials III, 69871W (6 May 2008); https://doi.org/10.1117/12.780734

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