Digital holographic microscopy for quantitative phase-contrast imaging

Huaying Wang; Rui Han; Zhiwei Tang

doi:10.1117/12.828783

20 May 2009 Digital holographic microscopy for quantitative phase-contrast imaging

Huaying Wang, Rui Han, Zhiwei Tang

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72833P (2009) https://doi.org/10.1117/12.828783
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

In this paper, a simple experimental setup with an off-axis lenless Fourier arrangement without pre-magnification is built. Based on common recording conditions of digital hologram, an improved recording condition is proposed, with which higher resolution of reconstructed image can be obtained. By using a USAF test target as microscopic object, the digital hologram is recorded by a "SensiCam" CCD sensor, which has an array of 1317×1035 pixels with 6.8μm x 6.8μm pixel size. Based on Fresnel diffraction formula, the recorded hologram is reconstructed numerically. The lateral resolution of 2.76 μm without any pre-magnification has been demonstrated experimentally. The corresponding theoretical resolution limitation is 2.39 μm. The result matches the theoretical prediction very well. In order to reconstruct three-dimensional information, the recording parameters, such as the recording distance and the offset of the reference point source, are determined accurately by using a synthetic method of an automatic phase correction procedure and a manual adjustment process. Then, the accurate phase image can be obtained. The axial resolution better than 10nm has been also demonstrated experimentally.

Citation Download Citation

Huaying Wang, Rui Han, and Zhiwei Tang "Digital holographic microscopy for quantitative phase-contrast imaging", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72833P (20 May 2009); https://doi.org/10.1117/12.828783

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