Paper
10 February 2010 Quantifying heat transfer in DMD-based optoelectronic tweezers with infrared thermography
Peter J. Pauzauskie, Hsan-Yin Hsu, Arash Jamshidi, Justin K. Valley, Shao Ning Pei, Ming C. Wu
Author Affiliations +
Abstract
Optoelectronic tweezers (OET) have emerged in recent years as a powerful form of optically-induced dielectrophoresis for addressing single cells and trapping individual nanostructures with DMD-based virtual-electrodes. In this technique an alternating electric field is used to induce a dipole within structures of interest while very low-intensity optical images are used to produce local electric field gradients that create dynamic trapping potentials. Addressing living cells, particularly for heat-sensitive cell lines, with OET's optical virtual-electrodes requires an in-depth understanding of heating profiles within OET devices. In this work we present quantitative measurements of the thermal characteristics of single-crystalline-silicon phototransistor based optoelectronic tweezers (PhOET). Midwave infrared (3 - 5 micron) thermographic imaging is used to determine relative heating in PhOET devices both with and without DMD-based optical actuation. Temperature increases of approximately 2°C from electrolyte Joule-heating are observable in the absence of DMD-illumination when glass is used as a support for PhOET devices. An additional temperature increase of no more than 0.2°C is observed when DMD-illumination is used. Furthermore, significantly reduced heating can be achieved when devices are fabricated in direct contact with a metallic heat-sink.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter J. Pauzauskie, Hsan-Yin Hsu, Arash Jamshidi, Justin K. Valley, Shao Ning Pei, and Ming C. Wu "Quantifying heat transfer in DMD-based optoelectronic tweezers with infrared thermography", Proc. SPIE 7596, Emerging Digital Micromirror Device Based Systems and Applications II, 759609 (10 February 2010); https://doi.org/10.1117/12.846247
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Cited by 5 scholarly publications.
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KEYWORDS
Glasses

Thermography

Silicon

Temperature metrology

Thermoelectric materials

Optoelectronics

Cameras

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