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Proceedings Article

Low noise planar external cavity laser for interferometric fiber optic sensors

[+] Author Affiliations
Mazin Alalusi, Paul Brasil, Sanggeon Lee, Peter Mols, Lew Stolpner, Axel Mehnert, Steve Li

Redfern Integrated Optics, Inc. (USA)

Proc. SPIE 7316, Fiber Optic Sensors and Applications VI, 73160X (April 27, 2009); doi:10.1117/12.828849
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From Conference Volume 7316

  • Fiber Optic Sensors and Applications VI
  • Eric Udd; Henry H. Du; Anbo Wang
  • Orlando, Florida, USA | April 13, 2009

abstract

A 1550 nm DWDM planar external cavity laser (ECL) is demonstrated to provide low phase/frequency noise, narrow linewidth, and low RIN. The cavity includes a semiconductor gain chip and a planar lightwave circuit waveguide with Bragg grating, packaged in a 14-pin butterfly package. This planar ECL laser is designed to operate under vibration and in harsh environmental conditions. The laser shows linewidth ≤ 2.6 kHz, phase/frequency noise comparable with that of long cavity fiber lasers, RIN ≤ -147dB/Hz at 1kHz, and power ≥ 10mW. Performance is suitable for various high performance fiber optic sensing systems, including interferometric sensing in Oil and Gas, military/security and other applications, currently served mostly by costly and less reliable laser sources.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Mazin Alalusi ; Paul Brasil ; Sanggeon Lee ; Peter Mols ; Lew Stolpner, et al.
"Low noise planar external cavity laser for interferometric fiber optic sensors", Proc. SPIE 7316, Fiber Optic Sensors and Applications VI, 73160X (April 27, 2009); doi:10.1117/12.828849; http://dx.doi.org/10.1117/12.828849


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