Paper
16 February 2010 Novel types of silicon waveguides fabricated using proton beam irradiation
E. J. Teo, P. Yang, B. Q. Xiong, M. B. H. Breese, G. Z. Mashanovich, Y. S. Ow, G. T. Reed, A. A. Bettiol
Author Affiliations +
Proceedings Volume 7606, Silicon Photonics V; 76060M (2010) https://doi.org/10.1117/12.841536
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
In this work, we describe the use of a combination of proton beam irradiation and electrochemical etching to fabricate high index-contrast waveguides directly in silicon without the need for silicon-on-insulator substrate. Various types of waveguides with air or porous silicon cladding have been demonstrated. We show that porous silicon (PS) is a flexible cladding material due to the tunability of its refractive index and thickness. The Si/PS waveguide system also possesses better transmittance in the ranges of 1.2-9 and 23-200 μm, compared to Si/SiO2 waveguides. This is potentially important for mid and far-IR applications. Since it is compatible with conventional CMOS technology, this process can be used for fabrication of integrated optoelectronics circuits.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. J. Teo, P. Yang, B. Q. Xiong, M. B. H. Breese, G. Z. Mashanovich, Y. S. Ow, G. T. Reed, and A. A. Bettiol "Novel types of silicon waveguides fabricated using proton beam irradiation", Proc. SPIE 7606, Silicon Photonics V, 76060M (16 February 2010); https://doi.org/10.1117/12.841536
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KEYWORDS
Waveguides

Silicon

Cladding

Ions

Electrochemical etching

Oxides

Picosecond phenomena

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