Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm

Laurent Lamaignère; Marc Loiseau; Thierry Donval; Roger Courchinoux; Stéphane Bouillet; Jean-Christophe Poncetta; Bertrand Bertussi; Hervé Bercegol

doi:10.1117/12.820580

18 May 2009 Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm

Laurent Lamaignère, Marc Loiseau, Thierry Donval, Roger Courchinoux, Stéphane Bouillet, Jean-Christophe Poncetta, Bertrand Bertussi, Hervé Bercegol

Author Affiliations +

Proceedings Volume 7361, Damage to VUV, EUV, and X-Ray Optics II; 73610M (2009) https://doi.org/10.1117/12.820580
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

A rasterscan test procedure [L. Lamaignère et al, Rev. Sci. Instrumen. 78, 103105 (2007)] has been implemented in order to determine low laser damage density of large aperture UV fused silica optics. This procedure was improved in terms of accuracy and repeatability. Tests have been carried on several facilities using several pulse durations and spatial distributions. We describe the equipment, test procedure and data analysis to perform this damage test with small beams (Gaussian beams, about 1mm @ 1/e, and top hat beams). Then, beam overlap and beam shape are the two key parameters which are taken into account in order to determine damage density. After data analysis and treatment, a repeatable metrology has been obtained. Moreover, the consideration of error bars on defects distributions permits to compare data between these installations. This allows us to reach reproducibility, a necessary condition in order to share results and to make reliable predictions of laser damage resistance.

Citation Download Citation

Laurent Lamaignère, Marc Loiseau, Thierry Donval, Roger Courchinoux, Stéphane Bouillet, Jean-Christophe Poncetta, Bertrand Bertussi, and Hervé Bercegol "Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm", Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610M (18 May 2009); https://doi.org/10.1117/12.820580

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