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Proceedings Article

Toward a better understanding of multi-wavelength effects on KDP crystals

[+] Author Affiliations
Stéphane Reyné, Marc Loiseau, Laurent Lamaignère

CEA/CESTA (France)

Guillaume Duchateau

CEA/Le Ripault (France)

Jean-Yves Natoli

Institut Fresnel, CNRS (France)

Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610Z (May 18, 2009); doi:10.1117/12.822852
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From Conference Volume 7361

  • Damage to VUV, EUV, and X-Ray Optics II
  • Libor Juha; Saša Bajt; Ryszard Sobierajski
  • Prague, Czech Republic | April 20, 2009

abstract

Laser damage in KDP crystals has been studied since several years and more accurately with emergence of projects like LMJ (Laser MégaJoule, in France) or NIF (National Ignition Facility, in US). Laser damage tests are essentially performed at 351-nm wavelength (3ω), with regards to their optical behaviours on forementioned facilities. But only few data are available at 1064 nm (1ω) and at 532 nm (2ω), and even with wavelength-mixing more representative of operational conditions of KDP crystals. So in a first approach, we tried to carry out an identity chart of the crystal by performing mono-wavelength tests at 1ω, 2ω and 3ω. Then, a campaign of combination of multi-wavelength (typically 3ω and 1ω) tests has been started with several temporal delays between 3ω and 1ω pulses. These first results lead us to improve pre-existing modelling codes developed by CEA, which have proved their robustness to 3ω -experiment results. Foremost interests consist in implementing wavelength dependency and energy deposition mechanism as a consequence of our first observations on KDP.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Stéphane Reyné ; Marc Loiseau ; Guillaume Duchateau ; Jean-Yves Natoli and Laurent Lamaignère
"Toward a better understanding of multi-wavelength effects on KDP crystals", Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610Z (May 18, 2009); doi:10.1117/12.822852; http://dx.doi.org/10.1117/12.822852


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