Remote laboratory for digital holographic metrology

Marc Wilke; Igor Alekseenko; Guohai Situ; Konica Sarker; Margarita Riedel; Giancarlo Pedrini; Wolfgang Osten

doi:10.1117/12.892073

26 May 2011 Remote laboratory for digital holographic metrology

Marc Wilke, Igor Alekseenko, Guohai Situ, Konica Sarker, Margarita Riedel, Giancarlo Pedrini, Wolfgang Osten

Proceedings Volume 8082, Optical Measurement Systems for Industrial Inspection VII; 80820D (2011) https://doi.org/10.1117/12.892073
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

Advances in information technology open up the potential of combining optical systems with net based infrastructures, allowing for remote inspection and virtual metrology. In this paper, we report our recent work on building a remote laboratory for digital holographic metrology. We describe the architecture and the techniques involved in setting up the remote controlling metrology system. Further consideration will be given to the integration into an advanced infrastructure for remote experimentation, data storage and publication. Some other important issues such as information security will not be addressed.

Citation Download Citation

Marc Wilke, Igor Alekseenko, Guohai Situ, Konica Sarker, Margarita Riedel, Giancarlo Pedrini, and Wolfgang Osten "Remote laboratory for digital holographic metrology", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820D (26 May 2011); https://doi.org/10.1117/12.892073

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