Paper
26 September 2011 Optical birefringence in a bideposited symmetric nanorod arrays
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Abstract
In this work, the birefringence of bideposited symmetric nanorod array is investigated. The Ta2O5 nanorod arrays composed of several subdeposits are fabricated by serial bideposition (SBD) technique. Each nanorod consists of several identical units and each unit consists of symmetrical sections ABA. From the lateral view of the structure, the nanorod array is a symmetrical multilayered. The deposition planes for layer A and layer B are perpendicular to each other. For normal incident ray, the polarization-dependent refractive indices and phase thicknesses of the film are presented as functions of wavelength and optical constants of each layer. The transmittance spectra of symmetrical sections have a pass band property as the equivalent refractive indices are real. The principal indices of the Ta2O5 nanorod arrays with each subideposition thickness of 3 nm associated with the two orthogonal polarizations are measured by ellipsometer when the deposition angle is changed from 70° to 80°. According to principal indices database, a uniform phase retardation between the two orthogonal polarization directions can be designed for a specific wavelength range.
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Yi-Jun Jen, Ching-Wei Yu, Meng-Jie Lin, and Chia-Feng Lin "Optical birefringence in a bideposited symmetric nanorod arrays", Proc. SPIE 8104, Nanostructured Thin Films IV, 81040D (26 September 2011); https://doi.org/10.1117/12.894377
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KEYWORDS
Multilayers

Nanorods

Refractive index

Wave plates

Birefringence

Databases

Polarization

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