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Proceedings Article

A single-shot intensity-position monitor for hard x-ray FEL sources

[+] Author Affiliations
Yiping Feng, Jan M. Feldkamp, David M. Fritz, Marco Cammarata, Robert Aymeric, Chiara Caronna, Henrik T. Lemke, Diling Zhu, Sooheyong Lee, Sebastien Boutet, Garth Williams, Jerome B. Hastings

SLAC National Accelerator Lab. (USA)

Kensuke Tono, Makina Yabashi

RIKEN (Japan)

Proc. SPIE 8140, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications IX, 81400Q (October 05, 2011); doi:10.1117/12.893740
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From Conference Volume 8140

  • X-Ray Lasers and Coherent X-Ray Sources: Development and Applications IX
  • James Dunn; Annie Klisnick
  • San Diego, California, USA | August 21, 2011

abstract

An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 μm, limited only by the Poisson statistics of the X-rays collected in a single shot.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Yiping Feng ; Jan M. Feldkamp ; David M. Fritz ; Marco Cammarata ; Robert Aymeric, et al.
"A single-shot intensity-position monitor for hard x-ray FEL sources", Proc. SPIE 8140, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications IX, 81400Q (October 05, 2011); doi:10.1117/12.893740; http://dx.doi.org/10.1117/12.893740


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