Testing and calibration of phase plates for JWST optical simulator

Qian Gong; Jenny Chu; Severine Tournois; William Eichhorn; David Kubalak

doi:10.1117/12.892125

30 September 2011 Testing and calibration of phase plates for JWST optical simulator

Qian Gong, Jenny Chu, Severine Tournois, William Eichhorn, David Kubalak

Proceedings Volume 8150, Cryogenic Optical Systems and Instruments XIII; 81500M (2011) https://doi.org/10.1117/12.892125
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Three phase plates were designed to simulate the JWST segmented primary mirror wavefront at three on-orbit alignment stages: coarse phasing, intermediate phasing, and fine phasing. The purpose is to verify JWST's on-orbit wavefront sensing capability. Amongst the three stages, coarse alignment is defined to have piston error between adjacent segments being 30 μm to 300 μm, intermediate being 0.4 μm to 10 μm, and fine being below 0.4 μm. The phase plates were made of fused silica, and were assembled in JWST Optical Simulator (OSIM). The piston difference was realized by the thickness difference of two adjacent segments. The two important parameters to phase plates are piston and wavefront errors. Dispersed Fringe Sensor (DFS) method was used for initial coarse piston evaluation, which is the emphasis of this paper. Point Diffraction Interferometer (PDI) is used for fine piston and wavefront error. In order to remove piston's 2π uncertainty with PDI, three laser wavelengths, 640nm, 660nm, and 780nm, are used for the measurement. The DHS test setup, analysis algorithm and results are presented. The phase plate design concept and its application (i.e. verifying the JWST on-orbit alignment algorithm) are described. The layout of JWST OSIM and the function of phase plates in OSIM are also addressed briefly.

Citation Download Citation

Qian Gong, Jenny Chu, Severine Tournois, William Eichhorn, and David Kubalak "Testing and calibration of phase plates for JWST optical simulator", Proc. SPIE 8150, Cryogenic Optical Systems and Instruments XIII, 81500M (30 September 2011); https://doi.org/10.1117/12.892125

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