SWIR HgCdTe HDVIP detectors MTF Monte Carlo modeling and data

A. I. D'Souza; M. G. Stapelbroek; C. Yoneyama; P. Ely; M. R. Skokan; H. D. Shih

doi:10.1117/12.849554

3 May 2010 SWIR HgCdTe HDVIP detectors MTF Monte Carlo modeling and data

A. I. D'Souza, M. G. Stapelbroek, C. Yoneyama, P. Ely, M. R. Skokan, H. D. Shih

Proceedings Volume 7660, Infrared Technology and Applications XXXVI; 76600Q (2010) https://doi.org/10.1117/12.849554
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

The photocurrent of High Density Vertically Integrated Photodiodes (HDVIP) manufactured in LPE grown SWIR (λc ~ 2.5 μm) HgCdTe material is modeled as a function of incident spot location using a Monte Carlo diffusion calculation in the p-type bulk. The Monte Carlo calculation assumes a 3 x 3 mini-array of detectors surrounded by guard detectors. Carriers generated in the n-regions are always collected. The result is a responsivity map that yields the individual detector "spot scan" profile that is then used to calculate the detector modulation transfer function (MTF). Fourier transforms of detector "spot scan" response profile provided experimental confirmation of MTF that corresponded to the Monte Carlo modeled MTF.

Citation Download Citation

A. I. D'Souza, M. G. Stapelbroek, C. Yoneyama, P. Ely, M. R. Skokan, and H. D. Shih "SWIR HgCdTe HDVIP detectors MTF Monte Carlo modeling and data", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76600Q (3 May 2010); https://doi.org/10.1117/12.849554

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