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Proceedings Article

A 5.5Mpixel 100 frames/sec wide dynamic range low noise CMOS image sensor for scientific applications

[+] Author Affiliations
Boyd Fowler, Chiao Liu, Steve Mims, Janusz Balicki, Wang Li, Hung Do, Jeff Appelbaum, Paul Vu

Fairchild Imaging (USA)

Proc. SPIE 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI, 753607 (January 25, 2010); doi:10.1117/12.846975
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From Conference Volume 7536

  • Sensors, Cameras, and Systems for Industrial/Scientific Applications XI
  • Erik Bodegom; Valérie Nguyen
  • San Jose, California | January 17, 2010

abstract

In this paper we describe a 5.5Mpixel 100 frames/sec wide-dynamic-range low-noise CMOS image sensor (CIS) designed for scientific applications. The sensor has 6.5μm pitch 5T pixels with pinned photodiodes and integrated microlenses. The 5T pixel architecture enables low noise rolling and global shutter operation. The measured peak quantum efficiency of the sensor is greater than 55% at 550nm, the Nyquist MTF is greater than 0.4 at 550nm, and the linear full well capacity is greater than 35ke-. The measured rolling and global shutter readout noise are 1.28e- RMS and 2.54e- RMS respectively at 30 f/s and 20°C. The pinned photodiode dark current is less than 3.8pA/cm2 at 20°C. The sensor achieves an intra-scene linear dynamic range in rolling shutter operation of greater than 86dB (20000:1) at room temperature. In global shutter readout the shutter efficiency is greater than 1000:1 with 500nm illumination.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Boyd Fowler ; Chiao Liu ; Steve Mims ; Janusz Balicki ; Wang Li, et al.
"A 5.5Mpixel 100 frames/sec wide dynamic range low noise CMOS image sensor for scientific applications", Proc. SPIE 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI, 753607 (January 25, 2010); doi:10.1117/12.846975; http://dx.doi.org/10.1117/12.846975


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