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Proceedings Article

Investigation on phase compensation method for measurement of resistance of quartz crystal

[+] Author Affiliations
Yanlin Wang

Beihang Univ. (China) and Beijing Information Science & Technology Univ. (China)

Zhongyu Wang

Beihang Univ. (China)

Dong Li, Guili Liu

Beijing Information Science & Technology Univ. (China)

Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79971P (May 26, 2011); doi:10.1117/12.891856
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From Conference Volume 7997

  • Fourth International Seminar on Modern Cutting and Measurement Engineering
  • Jiezhi Xin; Lianqing Zhu; Zhongyu Wang
  • Beijing, China | December 10, 2010

abstract

Resistance is one of four basic parameters of quartz crystal, and the others can be deducted from it. However, its strict requirements on fabrication technology for π network, and the phase shift induced by tray reactance and quartz crystal static capacitance, the highest accuracy measurements of resistance is difficult to be realized. Here, active compensation to additional-phase offset induced by stray reactance in π network and quartz crystal static capacitance (C0 ) is presented, which facilitates measurement of resistance of quartz crystal, and reduces the requirements of fabrication technology for π network. The experimental result indicates that the measurement accuracy of resistance R1 in quartz crystal can be up to ±5% with this measurement system.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Yanlin Wang ; Zhongyu Wang ; Dong Li and Guili Liu
"Investigation on phase compensation method for measurement of resistance of quartz crystal", Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79971P (May 26, 2011); doi:10.1117/12.891856; http://dx.doi.org/10.1117/12.891856


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