Paper
12 July 2011 Evaluation of the reasons why freshly appearing citrus peel fluorescence during automatic inspection by fluorescent imaging technique
Md. Abdul Momin, Naoshi Kondo, Makoto Kuramoto, Yuichi Ogawa, Kazuya Yamamoto, Tomoo Shiigi, Kazunori Ninomiya
Author Affiliations +
Proceedings Volume 8000, Tenth International Conference on Quality Control by Artificial Vision; 80000C (2011) https://doi.org/10.1117/12.890118
Event: 10th International Conference on Quality Control by Artificial Vision, 2011, Saint-Etienne, France
Abstract
Defective unshu oranges (Citrus reticulate Blanco var. unshu) were sorted based on fluorescent imaging technique in a commercial packinghouse but fresh appearing unshu were rejected due to fluorescence appearing on their peel. We studied the various visible patterns based on colour, fluorescence and microscopic images, where even areas of the peel that are not obviously damaged can have fluorescence, to provide a categorization of fluorescence reasons. The categorization corresponded to: 1) hole and flow; 2) influenced by damaged or rotten fruits that have released peel oil onto it; 3) immature or poor peel quality; 4) whitish fluorescence due to agro-chemicals and 5) variation of the growing season. The identification of such patterns of fluorescence might be useful for citrus grading industry to take some initiatives to make the entire automated system more efficient.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Md. Abdul Momin, Naoshi Kondo, Makoto Kuramoto, Yuichi Ogawa, Kazuya Yamamoto, Tomoo Shiigi, and Kazunori Ninomiya "Evaluation of the reasons why freshly appearing citrus peel fluorescence during automatic inspection by fluorescent imaging technique", Proc. SPIE 8000, Tenth International Conference on Quality Control by Artificial Vision, 80000C (12 July 2011); https://doi.org/10.1117/12.890118
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Cited by 2 scholarly publications.
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KEYWORDS
Luminescence

Ultraviolet radiation

Microscopes

Light emitting diodes

Machine vision

Image segmentation

Imaging systems

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