W-band direct detection radiometers using metamorphic HEMT technology

Ingmar Kallfass; Axel Huelsmann; Axel Tessmann; Arnulf Leuther; E. Weissbrodt; M. Schlechtweg; O. Ambacher

doi:10.1117/12.883473

26 May 2011 W-band direct detection radiometers using metamorphic HEMT technology

Ingmar Kallfass, Axel Huelsmann, Axel Tessmann, Arnulf Leuther, E. Weissbrodt, M. Schlechtweg, O. Ambacher

Proceedings Volume 8022, Passive Millimeter-Wave Imaging Technology XIV; 80220O (2011) https://doi.org/10.1117/12.883473
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

At this paper we report on a W-band direct detection radiometer cascading a single-pole four-throw switch with integrated 50 Ω load as a reference noise source, a 3 x 20 dB low-noise amplifier chain, and a broadband Schottky-diode detector. All components are designed and fabricated in 100 nm metamorphic high electron mobility transistor (mHEMT) technology and use waveguide packaging. By using 2 channels of the switch module the Dicke-principle is implemented to drastically reduce the inherent amplifier noise. The multi-throw switch insertion loss is less than 3.5 dB on the chip level and 4.4 dB on the module level. The entire W-band direct detection radiometer chain is also integrated on a single chip and packaged into a waveguide module, which was successfully tested and is now ready for system integration.

Citation Download Citation

Ingmar Kallfass, Axel Huelsmann, Axel Tessmann, Arnulf Leuther, E. Weissbrodt, M. Schlechtweg, and O. Ambacher "W-band direct detection radiometers using metamorphic HEMT technology", Proc. SPIE 8022, Passive Millimeter-Wave Imaging Technology XIV, 80220O (26 May 2011); https://doi.org/10.1117/12.883473

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