Spectral-feature-based analysis of reflectance and emission spectral libraries and imaging spectrometer data

Fred A. Kruse

doi:10.1117/12.918233

24 May 2012 Spectral-feature-based analysis of reflectance and emission spectral libraries and imaging spectrometer data

Fred A. Kruse

Author Affiliations +

Proceedings Volume 8390, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVIII; 83901F (2012) https://doi.org/10.1117/12.918233
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

This research demonstrates the application of spectral-feature-based analysis to identifying and mapping Earth-surface materials using spectral libraries and imaging spectrometer data. Feature extraction utilizing a continuum-removal and local minimum detection approach was tested for analysis of both reflectance and emissivity spectral libraries by extracting and characterizing spectral features of rocks, soils, minerals, and man-made materials. Library-derived information was then used to illustrate both reflectance- and emissivity-feature-based spectral mapping using imaging spectrometer data (AVIRIS and SEBASS). An additional spectral library of emission spectra from selected nocturnal lighting types was used to develop a database of key spectral features that allowed mapping and characterization of night lights from ProSpecTIR-VS imaging spectrometer data. Results from these case histories demonstrate that the spectralfeature- based approach can be used with either reflectance or emission spectra and applied to a wide variety of imaging spectrometer data types for extraction of key surface composition information.

Citation Download Citation

Fred A. Kruse "Spectral-feature-based analysis of reflectance and emission spectral libraries and imaging spectrometer data", Proc. SPIE 8390, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVIII, 83901F (24 May 2012); https://doi.org/10.1117/12.918233

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