We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to
be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic
Force Microscopy (AFM), X-ray Re
ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and
correlation between measured roughness and pre-coating characterization are reported. For coating development,
a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2
during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes
show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU
Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re
ectivity at the
grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating.
We present preliminary results on X-ray Re
ectometry and Cross-sectional Transmission Electron Microscopy
(TEM) of the W/Si multilayer.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Desiree Della Monica Ferreira ; Anders C. Jakobsen ; Finn E. Christensen ; Brian J. Shortt ; Michael Krumrey, et al.
"Development and characterization of coatings on silicon pore optics substrates for the ATHENA Mission", Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84435E (September 17, 2012); doi:10.1117/12.927290; http://dx.doi.org/10.1117/12.927290