Paper
24 September 2012 Design considerations for a background limited 350 micron pixel array using lumped element superconducting microresonators
Christopher M. McKenney, Henry G. Leduc, Loren J. Swenson, Peter K. Day, Byeong H. Eom, Jonas Zmuidzinas
Author Affiliations +
Abstract
Future submillimeter telescopes will demand arrays with 106 pixels to fill the focal plane. MAKO is a 350 μm camera being developed to demonstrate the use of superconducting microresonators to meet the high multiplexing factors required for scaling to large-format arrays while offering background-limited single-pixel sensitivity. Candidate pixel designs must simultaneously meet many requirements. To achieve the desired noise equivalent powers it must efficiently absorb radiation, feature a high responsivity, and exhibit low intrinsic device noise. Additionally, the use of high resonator quality factors of order ~ 105 and resonant frequencies of order fres ≈ 100 MHz are desirable in order to reduce the per-pixel bandwidth to a minimum set by telescope scan speeds. This allows a maximum number of pixels to be multiplexed in a fixed electronic bandwidth. Here we present measurement results of the first MAKO prototype array which meets these design requirements while demonstrating sufficient sensitivity for background-limited operation at ground-based, far-infrared telescopes.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher M. McKenney, Henry G. Leduc, Loren J. Swenson, Peter K. Day, Byeong H. Eom, and Jonas Zmuidzinas "Design considerations for a background limited 350 micron pixel array using lumped element superconducting microresonators", Proc. SPIE 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI, 84520S (24 September 2012); https://doi.org/10.1117/12.925759
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Cited by 32 scholarly publications.
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KEYWORDS
Resonators

Capacitors

Quasiparticles

Technetium

Multiplexing

Superconductors

Inductance

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