Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Graphene Raman imaging and spectroscopy processing: characterization of graphene growth

[+] Author Affiliations
Matias G. Babenco

Univ. Nacional de Córdoba (Argentina)

Li Tao, Deji Akinwande

The Univ. of Texas at Austin (United States)

Proc. SPIE 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI, 84660O (October 25, 2012); doi:10.1117/12.928711
Text Size: A A A
From Conference Volume 8466

  • Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
  • Michael T. Postek; Victoria A. Coleman; Ndubuisi G. Orji
  • San Diego, California, USA | August 12, 2012

abstract

Raman spectroscopy is a widely used metric to characterize the quality of graphene films prepared by exfoliation or synthesis. As research on graphene advances and graphene is grown over large scales, mapping of growth surface and analysis of Raman spectroscopy is necessary to promote metrology, quality quantification, fundamental research and advanced commercial applications. We present a novel data processing program for analysis of Raman spectroscopy, Graphene Raman Imaging and Spectroscopy Processing (GRISP). GRISP is capable of providing accurate statistical data on key features of the Raman spectrum of graphene over large areas, namely 2D, G and D peak intensity and intensity ratios between 2D to G (I2D/IG) and D to G (ID/IG) as well as Full Width at Half-Maximum of the 2D peak (FWHM2D). GRISP can also map processed data to form mapping images and histogram from which growth quality can be easily visualized and quantified. GRISP takes binary or text formatted raw data and can be directly accessed from nanoHUB platform, thus is universal and independent of the apparatus for Raman spectroscopy. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Matias G. Babenco ; Li Tao and Deji Akinwande
" Graphene Raman imaging and spectroscopy processing: characterization of graphene growth ", Proc. SPIE 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI, 84660O (October 25, 2012); doi:10.1117/12.928711; http://dx.doi.org/10.1117/12.928711


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement


 

  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.